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RFP 2020-0156 - CFI - Serial Section Focus Ion Beam Scanning Electron Microscope (BF FIB-SEM)

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This tender with title RFP 2020-0156 - CFI - Serial Section Focus Ion Beam Scanning Electron Microscope (BF FIB-SEM) has been published on Bidding Source portal dated 16 Dec 2020 for the country of Canada. It has been categorized on Microscopes & Electron microscopes & Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

RFP 2020-0156 - CFI - Serial Section Focus Ion Beam Scanning Electron Microscope (BF FIB-SEM)
RFP - Request for Proposal (Formal)
AB-2020-06997
Canada
16 Dec 2020
15 Jan 2021
English
Microscopes , Electron microscopes , Scanning electron microscopes

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