43034-1A-RFP - IN-SITU (SCANNING ELECTRON MICROSCOPE (SEM)) NANO-MECHANIC TESTING EQUIPMENT

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This tender with title 43034-1A-RFP - IN-SITU (SCANNING ELECTRON MICROSCOPE (SEM)) NANO-MECHANIC TESTING EQUIPMENT has been published on Bidding Source portal dated 07 Jun 2024 for the country of Canada. It has been categorized on Scanning electron microscopes & Electron microscopes & Checking and testing apparatus. For similar tenders you can see tenders mentioned below of this page.

General Information

Canada

Tender Title :

43034-1A-RFP - IN-SITU (SCANNING ELECTRON MICROSCOPE (SEM)) NANO-MECHANIC TESTING EQUIPMENT

Tender Type :

RFP - Request for Proposal (Formal)

Country :

Canada

Publish Date :

7 Jun 2024

Closing Date :

20 Jun 2024

Notice Language :

English

Tender Categories (CPVs) :

Scanning electron microscopes , Electron microscopes , Checking and testing apparatus

Full Tender Details :

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43034-1A-RFP - IN-SITU (SCANNING ELECTRON MICROSCOPE (SEM)) NANO-MECHANIC TESTING EQUIPMENT

General Information

Canada

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