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43034-1A-RFP - IN-SITU (SCANNING ELECTRON MICROSCOPE (SEM)) NANO-MECHANIC TESTING EQUIPMENT

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This tender with title 43034-1A-RFP - IN-SITU (SCANNING ELECTRON MICROSCOPE (SEM)) NANO-MECHANIC TESTING EQUIPMENT has been published on Bidding Source portal dated 07 Jun 2024 for the country of Canada. It has been categorized on Scanning electron microscopes & Electron microscopes & Checking and testing apparatus. For similar tenders you can see tenders mentioned below of this page.

General Information

Canada

43034-1A-RFP - IN-SITU (SCANNING ELECTRON MICROSCOPE (SEM)) NANO-MECHANIC TESTING EQUIPMENT
RFP - Request for Proposal (Formal)
Canada
7 Jun 2024
20 Jun 2024
English
Scanning electron microscopes , Electron microscopes , Checking and testing apparatus

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