Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) system 1 Set - 11055

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This tender with title Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) system 1 Set - 11055 has been published on Bidding Source portal dated 09 Apr 2025 for the country of Japan. It has been categorized on Scanning electron microscopes & Electron microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

Japan

Tender Title :

Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) system 1 Set - 11055

Tender Type :

Invitation to Tender

Reference No. :

BS-11055

Country :

Japan

Publish Date :

9 Apr 2025

Notice Language :

English

Tender Categories (CPVs) :

Scanning electron microscopes , Electron microscopes

Full Tender Details :

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Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) system 1 Set - 11055

General Information

Japan

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