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Tsinghua University Focused Ion Beam Dual-beam Scanning Electron Microscope Procurement for High-Resolution Brain Microstructural Analysis

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This tender with title Tsinghua University Focused Ion Beam Dual-beam Scanning Electron Microscope Procurement for High-Resolution Brain Microstructural Analysis has been published on Bidding Source portal dated 22 Jan 2024 for the country of China . It has been categorized on Scanning electron microscopes & Medical equipments & Electron microscopes & Microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

Tsinghua University Focused Ion Beam Dual-beam Scanning Electron Microscope Procurement for High-Resolution Brain Microstructural Analysis
Invitation to Tender
China
北京市
22 Jan 2024
Chinese
Scanning electron microscopes , Medical equipments , Electron microscopes , Microscopes

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