Thermal Field Emission Scanning Electron Microscope Platform for Automated Particle Analysis - NIST-MML-24-SS03

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This tender with title Thermal Field Emission Scanning Electron Microscope Platform for Automated Particle Analysis - NIST-MML-24-SS03 has been published on Bidding Source portal dated 21 Nov 2023 for the country of United States. It has been categorized on Electron microscopes & Laboratory, optical and precision equipments (excl. glasses) & Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

United States

Tender Title :

Thermal Field Emission Scanning Electron Microscope Platform for Automated Particle Analysis - NIST-MML-24-SS03

Tender Type :

Expression of Interest

Country :

United States

Province/City :

GAITHERSBURG

Publish Date :

21 Nov 2023

Closing Date :

7 Dec 2023

Notice Language :

English

Tender Categories (CPVs) :

Electron microscopes , Laboratory, optical and precision equipments (excl. glasses) , Scanning electron microscopes

Full Tender Details :

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Thermal Field Emission Scanning Electron Microscope Platform for Automated Particle Analysis - NIST-MML-24-SS03

General Information

United States

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