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Thermal Field Emission Scanning Electron Microscope Platform for Automated Particle Analysis - 39bcc8893fa14675953f003f037b0fbc

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This tender with title Thermal Field Emission Scanning Electron Microscope Platform for Automated Particle Analysis - 39bcc8893fa14675953f003f037b0fbc has been published on Bidding Source portal dated 09 Nov 2023 for the country of United States. It has been categorized on Scanning electron microscopes & Electron microscopes & Laboratory, optical and precision equipments (excl. glasses). For similar tenders you can see tenders mentioned below of this page.

General Information

Thermal Field Emission Scanning Electron Microscope Platform for Automated Particle Analysis - 39bcc8893fa14675953f003f037b0fbc
Expression of Interest
United States
GAITHERSBURG
9 Nov 2023
7 Dec 2023
English
Scanning electron microscopes , Electron microscopes , Laboratory, optical and precision equipments (excl. glasses)

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