loader

World Tenders & Procurement Opportunities

Search
Advanced Search

Awarded - Suite of Focused Ion Beam and Scanning Electron Microscope Instruments - NB6800002300593

World Biggest Tenders Source

This tender with title Awarded - Suite of Focused Ion Beam and Scanning Electron Microscope Instruments - NB6800002300593 has been published on Bidding Source portal dated 18 Sep 2023 for the country of United States. It has been categorized on Scanning electron microscopes & Electron microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

United States

Awarded - Suite of Focused Ion Beam and Scanning Electron Microscope Instruments - NB6800002300593
Contract Award
United States
18 Sep 2023
English
Scanning electron microscopes , Electron microscopes

For viewing full details of tenders, you should Log in to your account. If not registered yet, Please Register Now

Or Request a call back now and one of our representatives will contact you. Contact us

Similar Tenders

Scanning Electron Microscope (SEM) Maintenance Agreement - W913T25Q0002 -- 6650 - OPTICAL INSTRUMENTS, TEST EQUIPMENT, COMPONENTS AND ACCESSORIES United States CHIPS R&D: Service Agreement for a Hitachi S5500 Scanning Electron Microscope (SEM) - NIST-SS25-CHIPS-0014 -- J066 - MAINT/REPAIR/REBUILD OF EQUIPMENT- INSTRUMENTS AND LABORATORY EQUIPMENT United States Field-Emission Scanning Electron Microscope (FE-SEM) - 4-B175-Q-00761-00 -- 6640 - LABORATORY EQUIPMENT AND SUPPLIES United States Scanning electron microscope maintenance - ScanningelectronmicroscopemaintenanceRFI -- J036 - MAINT/REPAIR/REBUILD OF EQUIPMENT- SPECIAL INDUSTRY MACHINERY United States Field-Emission Scanning Electron Microscope (FE-SEM) - 4-B175-Q-00761-00 -- 6640 - LABORATORY EQUIPMENT AND SUPPLIES United States Scanning Electron Microscope for X-ray Tomography - 1333ND24QNB030562 -- 6640 - LABORATORY EQUIPMENT AND SUPPLIES United States One (1) Benchtop Scanning Electron Microscope capable of high-resolution imaging and spectroscopic characterization via energy-dispersive spectroscopy, equipped with a secondary electron detector (SED) and a back-scattered electron detector (BSE) - W911WX24Q0234 -- 6650 - OPTICAL INSTRUMENTS, TEST EQUIPMENT, COMPONENTS AND ACCESSORIES United States Benchtop Scanning Electron Microscope - 12405B24Q0278 -- 6640 - LABORATORY EQUIPMENT AND SUPPLIES United States Sources Sought for: One (1) Benchtop Scanning Electron Microscope capable of high-resolution imaging (350,000 times (X) magnification with greater than (<)10 resolution) - W911WX24Q0234 -- 6650 - OPTICAL INSTRUMENTS, TEST EQUIPMENT, COMPONENTS AND ACCESSORIES United States COMBINED SYNOPSIS/SOLICITATION Direct Electron Detector for NIEHS Talos Arctica cryogenic electron microscope - 75N96024Q00050 -- 6640 - LABORATORY EQUIPMENT AND SUPPLIES United States
Scanning electron microscopes Tenders
Electron microscopes Tenders
United States Tenders
North America Tenders
Tenders
No. 12, 1 st floor, Block B2, EGS Business Park, World Trade Center, Bakirkoy - Istanbul - Turkey
info@biddingsource.com
24 X 7 online support
TOP
For viewing latest tenders published for your business in all over the World: Sign in Join free
For accessing full details of Tenders, Kindly choose the Plan that works for you: View Subscription Plans