Tender fib-sem-nanocharakterisierungsplattform-5847579

This tender with title FIB-SEM-Nanocharakterisierungsplattform --

FIB-SEM nanocharacterization platform

has been published on Bidding Source portal dated 31 Jul 2023 for the country of Germany. It has been categorized on Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

FIB-SEM nanocharacterization platform

General Information

Germany

Tender Title :

FIB-SEM-Nanocharakterisierungsplattform
FIB-SEM nanocharacterization platform

Tender Type :

Invitation for Bids

Reference No. :

2023/S 142-454387

Country :

Germany

Province/City :

Germany-Lippstadt

Publish Date :

31 Jul 2023

Closing Date :

22 Aug 2023

Notice Language :

English

Tender Categories (CPVs) :

Scanning electron microscopes

Full Tender Details :

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FIB-SEM-Nanocharakterisierungsplattform

FIB-SEM nanocharacterization platform

FIB-SEM nanocharacterization platform

General Information

Germany

FIB-SEM nanocharacterization platform

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