Tender hochauflösendes zweistrahlgerät fib sem-5355762

This tender with title Hochauflösendes Zweistrahlgerät FIB SEM für die Chipanalyse -- Electron microscopes has been published on Bidding Source portal dated 16 Feb 2023 for the country of Germany. It has been categorized on Electron microscopes. For similar tenders you can see tenders mentioned below of this page.

Electron microscopes

General Information

Germany

Tender Title :

Hochauflösendes Zweistrahlgerät FIB SEM für die Chipanalyse
Electron microscopes

Tender Type :

Invitation for Bids

Reference No. :

2023/S 031-091337

Country :

Germany

Province/City :

Germany-Bonn

Publish Date :

16 Feb 2023

Closing Date :

23 Mar 2023

Notice Language :

English

Tender Categories (CPVs) :

Electron microscopes

Full Tender Details :

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Hochauflösendes Zweistrahlgerät FIB SEM für die Chipanalyse

Electron microscopes

General Information

Germany

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