Tender sem/fib metrology platform-5158396

This tender with title SEM/FIB metrology platform -- Scanning electron microscopes has been published on Bidding Source portal dated 24 Nov 2022 for the country of Sweden. It has been categorized on Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

Scanning electron microscopes

General Information

Sweden

Tender Title :

SEM/FIB metrology platform
Scanning electron microscopes

Tender Type :

Invitation for Bids

Reference No. :

2022/S 225-647593

Country :

Sweden

Province/City :

Sweden-Stockholm

Publish Date :

24 Nov 2022

Closing Date :

19 Dec 2022

Notice Language :

English

Tender Categories (CPVs) :

Scanning electron microscopes

Full Tender Details :

For viewing full details of tenders, you should Log in to your account. If not registered yet, Please Register Now

Or Request a call back now and one of our representatives will contact you. Contact us

Similar Tenders

Scanning electron microscopes – FIB-SEM with laser ablation - Sweden Sweden Scanning electron microscope -- Original Text --Svepelektronmikroskop Sweden Sweden - Two scanning electron microscopes (SEM) -- Two scanning electron microscopes (SEM) Sweden Sweden - High-end scanning electron microscope (SEM) -- High-end scanning electron microscope (SEM) Sweden Scanning electron microscope (SEM) with complimentary sample preparation capabilities -- Scanning electron microscopes Sweden Scanning Electron Microscope (SEM) -- Scanning electron microscopes Sweden SEM -- Scanning electron microscopes Sweden High-Resolution Scanning Electron Microscope Sweden Svepelektronmikroskop Sweden Field Emission Scanning Electron Microscope (FE-SEM) Sweden

SEM/FIB metrology platform

Scanning electron microscopes

General Information

Sweden

Similar Tenders

Scanning electron microscopes Tenders

Sweden Tenders

Europe Tenders

Tenders

info@biddingsource.com