This tender with title Plasma Focused Ion Beam (PFIB) mit Rasterelektronenmikroskop (SEM) -- Ion microscopes has been published on Bidding Source portal dated 28 Dec 2021 for the country of Germany. It has been categorized on Ion microscopes. For similar tenders you can see tenders mentioned below of this page.
Ion microscopes
General Information
Ion microscopes
For viewing full details of tenders, you should Log in to your account. If not registered yet, Please Register Now
Or Request a call back now and one of our representatives will contact you. Contact us