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Fourniture d’une sonde ionique focalisée à source plasma xénon (PFIB) couplée à un microscope électronique à balayage équipé d’un canon à émission de champ (MEB-FEG)

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This tender with title Fourniture d’une sonde ionique focalisée à source plasma xénon (PFIB) couplée à un microscope électronique à balayage équipé d’un canon à émission de champ (MEB-FEG) -- Scanning electron microscopes has been published on Bidding Source portal dated 25 Nov 2021 for the country of France. It has been categorized on Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

Scanning electron microscopes

General Information

France

Fourniture d’une sonde ionique focalisée à source plasma xénon (PFIB) couplée à un microscope électronique à balayage équipé d’un canon à émission de champ (MEB-FEG)
Scanning electron microscopes
Invitation for Bids
2021/S 228-599591
France
France-Grenoble
25 Nov 2021
20 Dec 2021
English
Scanning electron microscopes

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