This tender with title 聚焦离子束-扫描电镜双束系统 -- Focused ion beam-scanning electron microscope double beam system has been published on Bidding Source portal dated 18 Nov 2021 for the country of China . It has been categorized on Scanning electron microscopes & Electron microscopes & Medical equipments & Microscopes. For similar tenders you can see tenders mentioned below of this page.
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