1 set of High performance focused ion beam scanning electron microscope

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This tender with title 1 set of High performance focused ion beam scanning electron microscope has been published on Bidding Source portal dated 02 Aug 2021 for the country of Japan. It has been categorized on Microscopes & Scanning electron microscopes & Electron microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

Japan

Tender Title :

1 set of High performance focused ion beam scanning electron microscope

Tender Type :

Invitation to Tender

Country :

Japan

Publish Date :

2 Aug 2021

Notice Language :

English

Tender Categories (CPVs) :

Microscopes , Scanning electron microscopes , Electron microscopes

Full Tender Details :

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1 set of High performance focused ion beam scanning electron microscope

General Information

Japan

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