Tender focused ion beam scanning electron-2544926

This tender with title Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for Biological Specimens -- Scanning electron microscopes has been published on Bidding Source portal dated 12 Nov 2020 for the country of Finland. It has been categorized on Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

Scanning electron microscopes

General Information

Finland

Tender Title :

Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for Biological Specimens
Scanning electron microscopes

Tender Type :

Invitation for Bids

Reference No. :

2020/S 220-539551

Country :

Finland

Province/City :

Finland-Helsinki

Publish Date :

12 Nov 2020

Closing Date :

7 Dec 2020

Notice Language :

English

Tender Categories (CPVs) :

Scanning electron microscopes

Full Tender Details :

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Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for Biological Specimens

Scanning electron microscopes

General Information

Finland

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