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Lieferung eines Feldemissions-Rasterelektronenmikroskops mit integriertem Ionenfeinstrahl (engl. FIB-SEM) mit EDX und EBSD

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This tender with title Lieferung eines Feldemissions-Rasterelektronenmikroskops mit integriertem Ionenfeinstrahl (engl. FIB-SEM) mit EDX und EBSD -- Scanning electron microscopes has been published on Bidding Source portal dated 25 Aug 2020 for the country of Germany. It has been categorized on Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

Scanning electron microscopes

General Information

Lieferung eines Feldemissions-Rasterelektronenmikroskops mit integriertem Ionenfeinstrahl (engl. FIB-SEM) mit EDX und EBSD
Scanning electron microscopes
Invitation for Bids
2020/S 163-395930
Germany
Germany-Bochum
25 Aug 2020
23 Sep 2020
English
Scanning electron microscopes

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