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National University Corporation - Notice of request for comments - Focused Ion Beam Scanning Electron Microscope 1 Set

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This tender with title National University Corporation - Notice of request for comments - Focused Ion Beam Scanning Electron Microscope 1 Set has been published on Bidding Source portal dated 26 May 2020 for the country of Japan. It has been categorized on Microscopes & Electron microscopes & Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

Japan

National University Corporation - Notice of request for comments - Focused Ion Beam Scanning Electron Microscope 1 Set
Invitation to Tender
Japan
26 May 2020
English
Microscopes , Electron microscopes , Scanning electron microscopes

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