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Advanced Analytical (Scanning) Transmission Electron Microscope ((S)TEM) Optimised for Structural and Chemical Characterisation of Beam Sensitive Materials

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This tender with title Advanced Analytical (Scanning) Transmission Electron Microscope ((S)TEM) Optimised for Structural and Chemical Characterisation of Beam Sensitive Materials has been published on Bidding Source portal dated 07 Nov 2019 for the country of United Kingdom. It has been categorized on Transmission electron microscope. For similar tenders you can see tenders mentioned below of this page.

General Information

Advanced Analytical (Scanning) Transmission Electron Microscope ((S)TEM) Optimised for Structural and Chemical Characterisation of Beam Sensitive Materials
Contract notice
2019/S 213-522175
United Kingdom
United Kingdom-Manchester
7 Nov 2019
19 Nov 2019
English
Transmission electron microscope

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